Title :
An automatic test program generator
Author :
Ogata, Teruaki ; Ono, Tsunehiko ; Watanabe, Takao ; Ito, Kazuro
Author_Institution :
Mitsubishi Electric Co., Osaka, Japan
fDate :
28 Oct-1 Nov 1991
Abstract :
A test program generator that automatically generates test programs for LSI devices from general-purpose device test specifications is described. The AG-5 automatic test program generator consists of a hardware-independent front-end preprocessor that supports entry of device test specifications, a compiler to convert tester hardware and a reverse compiler to ensure that validated test parameter changes are reflected in the test specifications. The AG-5 program generation environment realizes large time savings by automatically generating programs in an easy-to-understand procedural language, and by ensuring that parameter changes in the test program are automatically reflected in the test specifications
Keywords :
automatic programming; automatic testing; integrated circuit testing; large scale integration; program compilers; AG-5; IC testing; LSI; automatic test program generator; compiler; reverse compiler; test specifications; Automatic programming; Automatic test pattern generation; Automatic testing; Circuit testing; Design engineering; Large scale integration; Microcomputers; Personnel; Program processors; System testing;
Conference_Titel :
Industrial Electronics, Control and Instrumentation, 1991. Proceedings. IECON '91., 1991 International Conference on
Conference_Location :
Kobe
Print_ISBN :
0-87942-688-8
DOI :
10.1109/IECON.1991.239068