DocumentCode :
3327058
Title :
Field emission characteristics of GaN roughened with H2 plasma
Author :
Kimura, Chiharu ; Yamamoto, Tomohide ; Sugino, Takashi
Author_Institution :
Dept. of Electr. Eng., Osaka Univ., Japan
fYear :
2001
fDate :
2001
Firstpage :
111
Lastpage :
112
Abstract :
It is known that gallium nitride (GaN) is one of the most attractive materials for blue light emitting diodes and blue lasers. From the experimental fact that the pyramid shape of GaN can be easily formed using the selective growth method by metalorganic chemical vapor deposition (MOCVD), an application of GaN to field emitter array is expected. In contrast to this, we have recently found that the GaN layer is etched with H2 plasma and that the roughened surface can be formed. This technique is applicable to fabrication of field emitters. This paper demonstrates electron emission from the GaN surface treated with H2 plasma
Keywords :
III-V semiconductors; MOCVD coatings; electron field emission; gallium compounds; rough surfaces; semiconductor growth; semiconductor thin films; sputter etching; wide band gap semiconductors; GaN; H2; H2 plasma etching; electron emission; fabrication; field emission; field emitter array; gallium nitride; metalorganic chemical vapor deposition; pyramid shape; selective growth; surface roughening; surface treatment; Chemical lasers; Gallium nitride; III-V semiconductor materials; Light emitting diodes; Optical materials; Plasma applications; Rough surfaces; Semiconductor laser arrays; Surface roughness; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Microelectronics Conference, 2001. IVMC 2001. Proceedings of the 14th International
Conference_Location :
Davis, CA
Print_ISBN :
0-7803-7197-6
Type :
conf
DOI :
10.1109/IVMC.2001.939678
Filename :
939678
Link To Document :
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