DocumentCode :
3327108
Title :
InGaN Multiple Quantum Well Blue LED Grown on Patterned Sapphire Substrates
Author :
Wang, Lianshan ; Liu, Sheng ; Feng, Zhechuan
Author_Institution :
Coll. of Mech. Sci. & Eng., Huazhong Univ. of Sci. & Technol., Wuhan, China
fYear :
2011
fDate :
16-18 May 2011
Firstpage :
1
Lastpage :
3
Abstract :
We reported the InGaN/GaN multiple quantum well (MQW) blue light-emitting diodes (LED) grown on patterned sapphire substrates (PSS). The surface morphologies for samples grown on the "dome" PSS in different growth stages were observed by scanning electron microscopy (SEM). The fully coalescence of the growth fronts was achieved for 30 minute growth sample with the "bumps" surface defects. We also used transmission electron microscopy (TEM) to analyze the LED layer structures grown on "dome" PSS. For lxl mm bare power chip measured with prober testing, the typical output power is up 345 mW at 350 mA current injection. The extraction efficiency of blue LED chip is enhanced at least by 25%, compared to those on c-planar sapphire. After white LEDs were simply packaged using blue LED chips and phosphor, the achievable better luminous flux was close to 98 lm for white LEDs grown on dome PSS. The effect of pattern sizes on the LED output power will be also discussed.
Keywords :
III-V semiconductors; gallium compounds; indium compounds; light emitting diodes; scanning electron microscopy; semiconductor growth; semiconductor quantum wells; semiconductor thin films; surface morphology; transmission electron microscopy; wide band gap semiconductors; Al2O3; InGaN multiple quantum well; InGaN-GaN; InGaN-GaN multiple quantum well; LED layer structures; SEM; TEM; blue LED chips; blue light-emitting diodes; current 350 mA; extraction efficiency; luminous flux; pattern size effect; patterned sapphire substrates; phosphor; prober testing; scanning electron microscopy; surface defects; surface morphologies; time 30 min; transmission electron microscopy; white LED; Gallium nitride; Light emitting diodes; Power generation; Quantum well devices; Scanning electron microscopy; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photonics and Optoelectronics (SOPO), 2011 Symposium on
Conference_Location :
Wuhan
ISSN :
2156-8464
Print_ISBN :
978-1-4244-6555-2
Type :
conf
DOI :
10.1109/SOPO.2011.5780547
Filename :
5780547
Link To Document :
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