DocumentCode
3327123
Title
A methodology for low cost electromagnetic compatibility testing at the prototype stage of development
Author
Pratt, Guy E.
Author_Institution
Corp. R&D, Eaton Corp., Southfield, MI, USA
fYear
195
fDate
14-18 Aug 195
Firstpage
285
Lastpage
288
Abstract
The paper presents a low cost methodology for assessing electromagnetic compatibility of newly developed printed circuit assemblies without the need for exotic chambers and test equipment. Included in these procedures are a variety of “E” field probes, instructions for building these probes, and the test equipment needed to be successful. Correlation data between formal test procedures using an anechoic chamber and this procedure are included as part of the paper
Keywords
electric field measurement; electromagnetic compatibility; printed circuit testing; test equipment; E field probes; correlation data; instructions; low cost electromagnetic compatibility testing; newly developed printed circuit assemblies; prototype stage; test equipment; test procedures; Anechoic chambers; Assembly; Circuit testing; Costs; Electromagnetic compatibility; Electronic equipment testing; Laboratories; Probes; Prototypes; Test equipment;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 1995. Symposium Record., 1995 IEEE International Symposium on
Conference_Location
Atlanta, GA
Print_ISBN
0-7803-3608-9
Type
conf
DOI
10.1109/ISEMC.1995.523564
Filename
523564
Link To Document