DocumentCode
332719
Title
Approximate Reachability Don´t Cares for CTL model checking
Author
In-Ho Moon ; Jae-Young Jang ; Hachtel, G.D. ; Somenzi, F. ; Jun Yuan ; Pixley, C.
Author_Institution
Dept. of Electr. & Comput. Eng., Colorado Univ., Boulder, CO, USA
fYear
1998
fDate
8-12 Nov. 1998
Firstpage
351
Lastpage
358
Abstract
RDCs (Reachability Don´t Cares) can have a dramatic impact on the cost of CTL model checking (J. Yuan et al., 1997). Unfortunately, RDCs, being a global property, are often much more difficult to compute than the satisfying set of typical CTL formulas. We address this problem through the use of Approximate Reachability Don´t Cares (ARDCs), computed with the algorithms developed for the VERITAS sequential synthesis package (H. ho et al., 1990; 1996). Approximate reachable states represent an upper bound on the set of true reachable states, and thus a lower bound on the set of unreachable (Don´t Care) states. ARDCs can be 10X to 100X (or much more for very large circuits) cheaper to compute than RDCs, and in some cases have the same dramatic effect on CTL model checking as the real RDCs. We also discuss the application of ARDCs to the problem of exact computation of the RDCs themselves. Experiments on industrial benchmarks show that order of magnitude speedups are possible, and occur frequently. The experimental results presented strongly support our claim that ARDCs play a safe and important way out of a serious dilemma: RDCs are necessary for tractable model checking of many large circuits, but the computation of the RDCs themselves is often intractable. We include, and theoretically justify, significant extensions of the VERITAS algorithms, and show that they can be up to an order of magnitude faster, while computing a virtually identical upper bound.
Keywords
computational complexity; formal verification; reachability analysis; ARDCs; Approximate reachable states; CTL model checking; RDCs; Reachability; VERITAS algorithms; VERITAS sequential synthesis package; exact computation; global property; tractable model checking; virtually identical upper bound; Boolean functions; Circuits; Costs; Data structures; Latches; Reachability analysis; Robustness; State-space methods; Upper bound;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design, 1998. ICCAD 98. Digest of Technical Papers. 1998 IEEE/ACM International Conference on
Conference_Location
San Jose, CA, USA
Print_ISBN
1-58113-008-2
Type
conf
DOI
10.1109/ICCAD.1998.144290
Filename
742896
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