Title :
Node sampling: a robust RTL power modeling approach
Author :
Bogliolo, A. ; Benini, L.
Author_Institution :
Dipt. di Elettronica Inf. e Sistemistica, Bologna Univ., Italy
Abstract :
We propose a robust RTL power modeling methodology for functional units. Our models are consistently accurate over a wide range of input statistics, they are automatically constructed and can provide pattern-by-pattern power estimates. An additional desirable feature of our modeling methodology is the capability of accounting for the impact of technology variations, library changes and synthesis tools. Our methodology is based on the concept of node sampling, as opposed to more traditional approaches based on input sampling. We analyze the theoretical properties of node sampling and we formally show that it is a statistically sound approach. The superior robustness of our method is due to its limited dependency on pattern based characterization.
Keywords :
logic CAD; power electronics; statistical analysis; functional units; input statistics; library changes; node sampling; pattern-by-pattern power estimates; register transfer level; robust RTL power modeling approach; robust RTL power modeling methodology; robustness; statistically sound approach; synthesis tools; technology variations; Adders; Business; Computational modeling; Digital circuits; Finite impulse response filter; Libraries; Permission; Robustness; Sampling methods; Time to market;
Conference_Titel :
Computer-Aided Design, 1998. ICCAD 98. Digest of Technical Papers. 1998 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
1-58113-008-2
DOI :
10.1109/ICCAD.1998.144308