DocumentCode :
332737
Title :
Estimation of power sensitivity in sequential circuits with power macromodeling application
Author :
Zhanping Chen ; Roy, K. ; Chong, E.K.P.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear :
1998
fDate :
8-12 Nov. 1998
Firstpage :
468
Lastpage :
472
Abstract :
We propose a novel technique based on Markov chains to accurately estimate power sensitivities to primary inputs in CMOS sequential circuits. The power sensitivity defines the change in average power dissipation due to changes in the input signal specification. Such sensitivities are estimated as by-products of the average power estimation, leading to an efficient implementation. A key application of power sensitivities is to construct a power surface in the specification space so that power dissipation under any distribution of primary inputs can easily be obtained, thereby providing an effective power macromodel for high level power estimation. We demonstrate that such a power surface can be approximated by only a limited number of representative points. This will dramatically reduce the CPU and memory requirements. Results on a large number of benchmark circuits have verified the feasibility and accuracy of this technique.
Keywords :
CMOS logic circuits; Markov processes; integrated circuit modelling; sensitivity analysis; sequential circuits; CMOS sequential circuits; Markov chains; average power dissipation; average power estimation; benchmark circuits; input signal specification; power macromodeling application; power sensitivity estimation; power surface; specification space; Application software; Central Processing Unit; Minimization; Permission; Portable computers; Power dissipation; Power engineering and energy; Power engineering computing; Probability; Sequential circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 1998. ICCAD 98. Digest of Technical Papers. 1998 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
1-58113-008-2
Type :
conf
DOI :
10.1109/ICCAD.1998.144309
Filename :
742948
Link To Document :
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