DocumentCode :
3327605
Title :
Electrostatic analysis of ungated field emission diodes
Author :
Jaeger, D.L. ; Hren, J.J. ; Zhirnov, V.V.
Author_Institution :
North Carolina State Univ., Raleigh, NC, USA
fYear :
2001
fDate :
2001
Firstpage :
173
Lastpage :
174
Abstract :
In this paper, comparisons between numerical and experimental approximations of electrostatic fields and field enhancement factors for ungated field emission diodes are made
Keywords :
diodes; electric fields; numerical analysis; vacuum microelectronics; electrostatic fields; experimental approximations; field emission sources; field enhancement factors; numerical approximations; ungated field emission diodes; Diodes; Electrostatic analysis; Field emitter arrays; Geometry; Needles; Rough surfaces; Shape; Solid modeling; Surface morphology; Surface roughness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Microelectronics Conference, 2001. IVMC 2001. Proceedings of the 14th International
Conference_Location :
Davis, CA
Print_ISBN :
0-7803-7197-6
Type :
conf
DOI :
10.1109/IVMC.2001.939709
Filename :
939709
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3327605
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