DocumentCode
3327605
Title
Electrostatic analysis of ungated field emission diodes
Author
Jaeger, D.L. ; Hren, J.J. ; Zhirnov, V.V.
Author_Institution
North Carolina State Univ., Raleigh, NC, USA
fYear
2001
fDate
2001
Firstpage
173
Lastpage
174
Abstract
In this paper, comparisons between numerical and experimental approximations of electrostatic fields and field enhancement factors for ungated field emission diodes are made
Keywords
diodes; electric fields; numerical analysis; vacuum microelectronics; electrostatic fields; experimental approximations; field emission sources; field enhancement factors; numerical approximations; ungated field emission diodes; Diodes; Electrostatic analysis; Field emitter arrays; Geometry; Needles; Rough surfaces; Shape; Solid modeling; Surface morphology; Surface roughness;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Microelectronics Conference, 2001. IVMC 2001. Proceedings of the 14th International
Conference_Location
Davis, CA
Print_ISBN
0-7803-7197-6
Type
conf
DOI
10.1109/IVMC.2001.939709
Filename
939709
Link To Document