• DocumentCode
    332769
  • Title

    Fast and exact simultaneous gate and wire sizing by Lagrangian relaxation

  • Author

    Chung-Ping Chen ; Chu, C.C.N. ; Wong, D.F.

  • Author_Institution
    Dept. of Comput. Sci., Texas Univ., Austin, TX, USA
  • fYear
    1998
  • fDate
    8-12 Nov. 1998
  • Firstpage
    617
  • Lastpage
    624
  • Abstract
    The paper considers simultaneous gate and wire sizing for general VLSI circuits under the Elmore delay model (W.C. Elmore, 1948). We present a fast and exact algorithm which can minimize total area subject to maximum delay bound. The algorithm can be easily modified to give exact algorithms for optimizing several other objectives (e.g. minimizing maximum delay or minimizing total area subject to arrival time specifications at all inputs and outputs). No previous algorithm for simultaneous gate and wire sizing can guarantee exact solutions for general circuits. Our algorithm is an iterative one with a guarantee on convergence to global optimal solutions. It is based on Lagrangian relaxation and "one-gate/wire-at-a-time" local optimizations, and is extremely economical and fast. For example, we can optimize a circuit with 27648 gates and wires in about 36 minutes using render 23 MB memory on an IBM RS/6000 workstation.
  • Keywords
    IBM computers; VLSI; circuit CAD; delays; logic gates; Elmore delay model; IBM RS/6000 workstation; Lagrangian relaxation; arrival time specifications; exact algorithm; exact algorithms; general VLSI circuits; global optimal solutions; iterative algorithm; local optimizations; maximum delay; maximum delay bound; wire sizing; Circuit optimization; Delay effects; Integrated circuit interconnections; Integrated circuit technology; Iterative algorithms; Lagrangian functions; Permission; Very large scale integration; Wire; Workstations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design, 1998. ICCAD 98. Digest of Technical Papers. 1998 IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA, USA
  • Print_ISBN
    1-58113-008-2
  • Type

    conf

  • DOI
    10.1109/ICCAD.1998.144333
  • Filename
    743080