• DocumentCode
    3328001
  • Title

    Longevity studies in the CDF II silicon detector

  • Author

    Behari, Satyajit

  • Author_Institution
    Johns Hopkins Univ., Baltimore, MD, USA
  • fYear
    2009
  • fDate
    Oct. 24 2009-Nov. 1 2009
  • Firstpage
    257
  • Lastpage
    260
  • Abstract
    The CDF Run II silicon detector is the largest operating detector of its kind in High Energy Physics, collecting pp¿ collision data at the Fermilab Tevatron since 2001. It provides precision tracking and vertexing which played a critical role in the Bs mixing discovery and is essential to the ongoing Higgs Boson search and many other physics analyses carried out at CDF. Due to the prolonged Tevatron Run II program the detector faces unforeseen challenges while operating well beyond its design parameters. Of particular concern is the radiation aging of the silicon sensors which are expected to acquire ~10 fb-1 data, far above their design integrated luminosity of 2-3 fb-1. In this paper we discuss the impact of radiation damage to the sensors, their effect on the physics performance and expectations for future operations of the two inner layers, which have already inverted.
  • Keywords
    radiation effects; silicon radiation detectors; BS mixing discovery; CDF II silicon detector; Fermilab Tevatron; Higgs boson; Tevatron Run II program; design parameters; high energy physics; longevity studies; precision tracking; proton+antiproton collision; radiation aging; radiation damage; silicon sensors; silicon strip detectors; vertexing; Aging; Capacitive sensors; Collaboration; Face detection; Helium; Nuclear and plasma sciences; Physics; Radiation detectors; Silicon radiation detectors; Strips; CDF Run II; Silicon strip detectors; radiation damage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-3961-4
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2009.5401771
  • Filename
    5401771