• DocumentCode
    332821
  • Title

    A layout-based approach for ordering scan chain flip-flops

  • Author

    Makar, Samy

  • Author_Institution
    Cirrus Logic Inc., Fremont, CA, USA
  • fYear
    1998
  • fDate
    18-23 Oct 1998
  • Firstpage
    341
  • Lastpage
    347
  • Abstract
    A new practical layout-based approach for ordering flip-flop scan chains is presented. This approach can reduce the stitching wire length by an order of magnitude, and dramatically improve circuit routability
  • Keywords
    automatic testing; combinational circuits; design for testability; flip-flops; large scale integration; logic testing; C++ language; LSI; circuit routability; combinational logic; flip-flop scan chains; hierarchical layout; layout; scan chain flip-flops; scan order; stitching wire length; Circuits; Costs; Flip-flops; High level synthesis; Iterative algorithms; Logic; Routing; Testing; Traveling salesman problems; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1998. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5093-6
  • Type

    conf

  • DOI
    10.1109/TEST.1998.743172
  • Filename
    743172
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=332821