• DocumentCode
    3328391
  • Title

    Exploiting defect clustering to screen bare die for infant mortality failures: an experimental study

  • Author

    Lakin, David R., II ; Singh, Adit D.

  • Author_Institution
    MSFC, NASA Marshall Space Flight Center, Huntsville, AL, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    23
  • Lastpage
    30
  • Abstract
    We present the first experimental results to establish that a binning strategy based on defect clustering can be used to screen bare die for early life failures. The data for this study comes from the SEMATECH test methods experiment
  • Keywords
    automatic testing; boundary scan testing; integrated circuit testing; integrated circuit yield; multichip modules; production testing; CMOS burn-in data; IDDQ tests; IC manufacture; MCM; SEMATECH test methods experiment; VLSI; bare die screening; binning strategy; defect clustering; design verification patterns; early life failures; functional test; manufacturing defects; product quality; scan based delay fault tests; scan based stuck at fault tests; wafer probe tests; Application specific integrated circuits; Displays; Integrated circuit testing; Multichip modules; NASA; Probes; Production; Refining; Semiconductor device manufacture; Semiconductor device testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1999. Proceedings. International
  • Conference_Location
    Atlantic City, NJ
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5753-1
  • Type

    conf

  • DOI
    10.1109/TEST.1999.805610
  • Filename
    805610
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3328391