Title :
Exploiting defect clustering to screen bare die for infant mortality failures: an experimental study
Author :
Lakin, David R., II ; Singh, Adit D.
Author_Institution :
MSFC, NASA Marshall Space Flight Center, Huntsville, AL, USA
Abstract :
We present the first experimental results to establish that a binning strategy based on defect clustering can be used to screen bare die for early life failures. The data for this study comes from the SEMATECH test methods experiment
Keywords :
automatic testing; boundary scan testing; integrated circuit testing; integrated circuit yield; multichip modules; production testing; CMOS burn-in data; IDDQ tests; IC manufacture; MCM; SEMATECH test methods experiment; VLSI; bare die screening; binning strategy; defect clustering; design verification patterns; early life failures; functional test; manufacturing defects; product quality; scan based delay fault tests; scan based stuck at fault tests; wafer probe tests; Application specific integrated circuits; Displays; Integrated circuit testing; Multichip modules; NASA; Probes; Production; Refining; Semiconductor device manufacture; Semiconductor device testing;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805610
