Title :
Diagnosis method based on ΔIddq probabilistic signatures: experimental results
Author :
Thibeault, C. ; Boisvert, L.
Author_Institution :
Dept. of Electr. Eng., Ecole de Technol. Superieure, Montreal, Que., Canada
Abstract :
The purpose of this paper is to present experimental results validating a diagnosis method based on differential Iddq probabilistic signatures and on maximum likelihood estimation. First, SEMATECH Project S121 data is used to support assumptions about current behaviour. Then results obtained from an IC monitor containing controllable faults clearly show the capability of the method to identify the type of actual activated faults, in spite of a strong experimental current standard variation. These results validate previous simulation procedures, which are applied to estimate what can be expected with more common current standard variations
Keywords :
CMOS digital integrated circuits; automatic testing; electric current measurement; fault location; integrated circuit testing; leakage currents; logic testing; maximum likelihood estimation; monitoring; probability; CMOS IC testing; IC monitor; SEMATECH Project S121 data; diagnosis method; differential Iddq probabilistic signatures; maximum likelihood estimation; CMOS technology; Circuit faults; Circuit testing; Current measurement; Gaussian distribution; Histograms; Integrated circuit testing; Maximum likelihood estimation; Monitoring; Subthreshold current;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743299
