Diagnosis method based on ΔIddq probabilistic signatures: experimental results

Author

Thibeault, C. ; Boisvert, L.

Author_Institution

Dept. of Electr. Eng., Ecole de Technol. Superieure, Montreal, Que., Canada

fYear

1998

fDate

18-23 Oct 1998

Firstpage

1019

Lastpage

1026

Abstract

The purpose of this paper is to present experimental results validating a diagnosis method based on differential Iddq probabilistic signatures and on maximum likelihood estimation. First, SEMATECH Project S121 data is used to support assumptions about current behaviour. Then results obtained from an IC monitor containing controllable faults clearly show the capability of the method to identify the type of actual activated faults, in spite of a strong experimental current standard variation. These results validate previous simulation procedures, which are applied to estimate what can be expected with more common current standard variations

Keywords

CMOS digital integrated circuits; automatic testing; electric current measurement; fault location; integrated circuit testing; leakage currents; logic testing; maximum likelihood estimation; monitoring; probability; CMOS IC testing; IC monitor; SEMATECH Project S121 data; diagnosis method; differential Iddq probabilistic signatures; maximum likelihood estimation; CMOS technology; Circuit faults; Circuit testing; Current measurement; Gaussian distribution; Histograms; Integrated circuit testing; Maximum likelihood estimation; Monitoring; Subthreshold current;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1998. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-5093-6

Type

conf

DOI

10.1109/TEST.1998.743299

Filename

743299