Title :
The integration of boundary-scan test methods to a mixed-signal environment
Author_Institution :
ASSET InterTech Inc., Richardson, TX, USA
Abstract :
Considering that many circuit assemblies have significant mixed-signal content and looking forward to the adoption and use of the IEEE Std 1149.4 mixed-signal test bus, this paper will discuss integration of 1149.1/1149.4 boundary-scan test methods to the mixed-signal test environment
Keywords :
IEEE standards; boundary scan testing; integrated circuit testing; mixed analogue-digital integrated circuits; printed circuit testing; IEEE Standard 1149.4 mixed-signal test bus; analog signal pins; board networks; boundary-scan test methods integration; circuit assemblies; mixed-signal test environment; Analog integrated circuits; Assembly; Circuit testing; Digital integrated circuits; Electronic equipment testing; Integrated circuit testing; Logic testing; Pins; Probes; Test facilities;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805626
