DocumentCode
3328706
Title
The integration of boundary-scan test methods to a mixed-signal environment
Author
Ley, Adam W.
Author_Institution
ASSET InterTech Inc., Richardson, TX, USA
fYear
1999
fDate
1999
Firstpage
159
Lastpage
162
Abstract
Considering that many circuit assemblies have significant mixed-signal content and looking forward to the adoption and use of the IEEE Std 1149.4 mixed-signal test bus, this paper will discuss integration of 1149.1/1149.4 boundary-scan test methods to the mixed-signal test environment
Keywords
IEEE standards; boundary scan testing; integrated circuit testing; mixed analogue-digital integrated circuits; printed circuit testing; IEEE Standard 1149.4 mixed-signal test bus; analog signal pins; board networks; boundary-scan test methods integration; circuit assemblies; mixed-signal test environment; Analog integrated circuits; Assembly; Circuit testing; Digital integrated circuits; Electronic equipment testing; Integrated circuit testing; Logic testing; Pins; Probes; Test facilities;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1999. Proceedings. International
Conference_Location
Atlantic City, NJ
ISSN
1089-3539
Print_ISBN
0-7803-5753-1
Type
conf
DOI
10.1109/TEST.1999.805626
Filename
805626
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