Title :
High speed digital transceivers: A challenge for manufacturing
Author :
Cole, Clifford B. ; Warwick, Thomas Phillip
Author_Institution :
Lucent Technol., Allentown, PA, USA
Abstract :
The evolution of personal computers and network servers is pushing the micro-electronics industry to integrate high speed transceiver macrocells onto CMOS Integrated Circuits (IC). Some examples of high speed transceiver standards are: Fiberchannel, Gigabit Ethernet, NGIO, FireWire (IEEE 1394), USB 2.0 and VESA display standards. ASICs designed for DATACOM and TELECOM applications and standard products such as FireWire (IEEE 1394) are currently running in the 400 Mb/S to 800 Mb/S data rate range. Fast data rates, coupled with low voltage swings and differential buffers, such as LVDS (Low voltage differential swing) buffers, are presenting challenges to the current generation of ATE. It has now become technically feasible to integrate gigabit transceiver macrocells into CMOS ASIC´s. Gigabit transceivers are being designed into digital ASIC designs such as disk drive controllers and Ethernet switches. The need for high quality, yet low cost solutions to test these macrocells, and stand alone standard products, has become essential
Keywords :
CMOS digital integrated circuits; application specific integrated circuits; automatic test equipment; design for testability; high-speed integrated circuits; integrated circuit testing; local area networks; telecommunication equipment testing; telecommunication standards; transceivers; 400 to 800 Mbit/s; ASICs; ATE; CMOS ICs; DFT; Ethernet switches; Fiberchannel; FireWire; Gigabit Ethernet; LVDS buffers; differential buffers; disk drive controllers; fast data rates; gigabit transceiver macrocells; high quality low cost test solutions; high speed digital transceivers; high speed transceiver macrocells; low voltage swings; CMOS integrated circuits; Computer industry; Ethernet networks; Firewire; Low voltage; Macrocell networks; Manufacturing; Microcomputers; Network servers; Transceivers;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805632