Title :
SIA Roadmap: test must not limit future technologies
Author_Institution :
IBM Microelectron., Essex Junction, VT, USA
Abstract :
There will inevitably be much debate about the accuracy of the 1997 SIA Roadmap. Will we be building devices of 100M transistors that go at frequencies of a GHz by the year 2002-or will it happen later? Although many of the actual numbers and dates will be different than predicted in the SIA Roadmap, some key trends are obvious and will inevitably impact testing methods. These key trends include: increased design speeds, increased circuit densities, reduced time-to-market, increased integration of functional macros (systems-on-a-chip), and increased leakage currents. The SIA Roadmap trends suggest that functional testing will hit a number of barriers
Keywords :
automatic test equipment; automatic testing; design for testability; electronics industry; integrated circuit testing; research and development management; technological forecasting; ATE; DFT; IC test; R&D game plan; Roadmap accuracy; SIA Roadmap; advanced technology exploitation; functional macros; functional testing; future technology limitations; increased circuit densities; increased design speeds; increased integration; increased leakage current; reduced time-to-market; scan design; structural test; systems-on-a-chip; testing methods; Automatic test equipment; Automatic testing; Circuit testing; Integrated circuit testing; Manufacturing industries; Pins; Semiconductor device testing; Software testing; System testing; Time to market;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743351
