Title :
Design of a test simulation environment for test program development
Author_Institution :
Analog Devices, Limerick, Ireland
Abstract :
Analog Devices has developed its own custom test simulation environment. Five pilot projects have been successfully completed to-date using this product. The design of this test simulation environment is presented
Keywords :
automatic test equipment; automatic test pattern generation; automatic test software; integrated circuit testing; mixed analogue-digital integrated circuits; programming environments; virtual instrumentation; ADICE simulator; ATE simulation; IMAGE ExChange; Teradyne programming environment; analog subsystem; custom test simulation environment; digital subsystem; integrated environment; mixed signal test; simulation environment design; test program development; virtual test environment; Automatic test equipment; Automatic testing; Discrete event simulation; Emulation; Engines; Monitoring; Product design; Programming environments; Signal design; System testing;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805636
