• DocumentCode
    3328961
  • Title

    The mode stirred chamber-a cost effective EMC testing alternative

  • Author

    Spiegelaar, Hans ; Vanderheyden, Eric

  • Author_Institution
    AMP Eur. Dev. Centre, Netherlands
  • fYear
    195
  • fDate
    14-18 Aug 195
  • Firstpage
    368
  • Lastpage
    373
  • Abstract
    One of the key elemental factors related to product EMC compliance testing is cost. As the European norms advance toward completion and implementation, the need to address both emissions as well as susceptibility testing as part of the product development cycle becomes a factor which can not be ignored. One solution hereby proposed is the mode stirred, or mode tuned, chamber method of testing which provides many advantages. First there is the reduced capital cost of constructing such a facility and secondly, the minimal operational cost associated with the inherently short testing cycle. Other advantages over conventional methods abound which, together with a theoretical and an experimental perspective, form the subject of this paper
  • Keywords
    electromagnetic compatibility; electromagnetic interference; electronic equipment testing; product development; EMC compliance testing; emission testing; minimal operational cost; mode stirred chamber; mode tuned chamber; product development cycle; product testing; reduced capital cost; short testing cycle; susceptibility testing; Connectors; Costs; Electromagnetic compatibility; Electromagnetic measurements; Electromagnetic radiation; Electromagnetic shielding; Geometry; IEC; Product development; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1995. Symposium Record., 1995 IEEE International Symposium on
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    0-7803-3608-9
  • Type

    conf

  • DOI
    10.1109/ISEMC.1995.523583
  • Filename
    523583