DocumentCode
3328961
Title
The mode stirred chamber-a cost effective EMC testing alternative
Author
Spiegelaar, Hans ; Vanderheyden, Eric
Author_Institution
AMP Eur. Dev. Centre, Netherlands
fYear
195
fDate
14-18 Aug 195
Firstpage
368
Lastpage
373
Abstract
One of the key elemental factors related to product EMC compliance testing is cost. As the European norms advance toward completion and implementation, the need to address both emissions as well as susceptibility testing as part of the product development cycle becomes a factor which can not be ignored. One solution hereby proposed is the mode stirred, or mode tuned, chamber method of testing which provides many advantages. First there is the reduced capital cost of constructing such a facility and secondly, the minimal operational cost associated with the inherently short testing cycle. Other advantages over conventional methods abound which, together with a theoretical and an experimental perspective, form the subject of this paper
Keywords
electromagnetic compatibility; electromagnetic interference; electronic equipment testing; product development; EMC compliance testing; emission testing; minimal operational cost; mode stirred chamber; mode tuned chamber; product development cycle; product testing; reduced capital cost; short testing cycle; susceptibility testing; Connectors; Costs; Electromagnetic compatibility; Electromagnetic measurements; Electromagnetic radiation; Electromagnetic shielding; Geometry; IEC; Product development; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 1995. Symposium Record., 1995 IEEE International Symposium on
Conference_Location
Atlanta, GA
Print_ISBN
0-7803-3608-9
Type
conf
DOI
10.1109/ISEMC.1995.523583
Filename
523583
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