DocumentCode :
3328961
Title :
The mode stirred chamber-a cost effective EMC testing alternative
Author :
Spiegelaar, Hans ; Vanderheyden, Eric
Author_Institution :
AMP Eur. Dev. Centre, Netherlands
fYear :
195
fDate :
14-18 Aug 195
Firstpage :
368
Lastpage :
373
Abstract :
One of the key elemental factors related to product EMC compliance testing is cost. As the European norms advance toward completion and implementation, the need to address both emissions as well as susceptibility testing as part of the product development cycle becomes a factor which can not be ignored. One solution hereby proposed is the mode stirred, or mode tuned, chamber method of testing which provides many advantages. First there is the reduced capital cost of constructing such a facility and secondly, the minimal operational cost associated with the inherently short testing cycle. Other advantages over conventional methods abound which, together with a theoretical and an experimental perspective, form the subject of this paper
Keywords :
electromagnetic compatibility; electromagnetic interference; electronic equipment testing; product development; EMC compliance testing; emission testing; minimal operational cost; mode stirred chamber; mode tuned chamber; product development cycle; product testing; reduced capital cost; short testing cycle; susceptibility testing; Connectors; Costs; Electromagnetic compatibility; Electromagnetic measurements; Electromagnetic radiation; Electromagnetic shielding; Geometry; IEC; Product development; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1995. Symposium Record., 1995 IEEE International Symposium on
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-3608-9
Type :
conf
DOI :
10.1109/ISEMC.1995.523583
Filename :
523583
Link To Document :
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