• DocumentCode
    3329059
  • Title

    Radiation damage studies for the DØ Silicon Micro-strip Tracker at the Tevatron

  • Author

    Ye, Zhenyu

  • Author_Institution
    Fermi Nat. Accel. Lab., Batavia, IL, USA
  • fYear
    2009
  • fDate
    Oct. 24 2009-Nov. 1 2009
  • Firstpage
    163
  • Lastpage
    167
  • Abstract
    A Silicon Micro-strip Tracker has been operating at the DØ experiment at the Fermilab Tevatron collider (Batavia, Illinois, USA) since 2001. The sensor leakage current, full depletion voltage, signal size and noise level are continuously monitored for radiation damage. Predictions are also made for the detector parameters towards the end of the Tevatron Run II. These predictions are based on the locations and types of the sensors, our knowledge and measurements of the phenomenology of radiation damage as well as the actual dose received in the Tevatron environment. We present the results of these aging studies and predictions in this talk.
  • Keywords
    ageing; leakage currents; position sensitive particle detectors; radiation effects; silicon radiation detectors; DÃ\x98 experiment; Fermilab Tevatron collider; Silicon Microstrip Tracker; Tevatron Run II; aging; full depletion voltage; noise level; radiation damage; sensor leakage current; signal size; Chemical sensors; Collaboration; Detectors; Large Hadron Collider; Nuclear and plasma sciences; Sensor phenomena and characterization; Silicon; Strips; Surface-mount technology; USA Councils; D⊘; Silicon Micro-strip Tracker; Tevatron; radiation damage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-3961-4
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2009.5401825
  • Filename
    5401825