• DocumentCode
    3329361
  • Title

    Simultaneous Measurement of Surface Shape and Optical Homogeneity with Dual-Wavelength Phase-Shifting Digital Holography

  • Author

    Zheng, Xiaoyi ; Wang, Yurong ; Li, Jie ; Meng, Xiangfeng ; Sun, Yubao ; Du, Yanlong

  • Author_Institution
    Shandong Provincial Key Lab. of Laser Technol. & Applic., Shandong Univ., Jinan, China
  • fYear
    2011
  • fDate
    16-18 May 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Based on the difference of refractive index by different wavelengths in optical components, a novel method for measuring the optical homogeneity of optical components by using dual-wavelength phase-shifting digital holography has been proposed and verified by computer simulation. Meanwhile, this method could measure the surface shape of optical components accurately while we do not need to measure the front surface and rear surface of sample separately. Furthermore, the phase of reference wave and phase distortion caused by the object wave could be eliminated automatically, so the method has a function of automated optical wavefront distortion compensation, which can improve the measurement accuracy.
  • Keywords
    adaptive optics; holographic interferometry; optical distortion; phase shifting interferometry; refractive index measurement; surface topography measurement; automated optical wavefront distortion compensation; computer simulation; dual-wavelength phase-shifting digital holography; optical components; phase distortion; reference wave; refractive index; surface shape measurement; Holographic optical components; Holography; Optical distortion; Optical interferometry; Optical surface waves; Optical variables measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photonics and Optoelectronics (SOPO), 2011 Symposium on
  • Conference_Location
    Wuhan
  • ISSN
    2156-8464
  • Print_ISBN
    978-1-4244-6555-2
  • Type

    conf

  • DOI
    10.1109/SOPO.2011.5780653
  • Filename
    5780653