Title :
The PIMager: A new tool for high sensitive digital β autoradiograph
Author :
Donnard, J. ; Arlicot, N. ; Berny, R. ; Carduner, H. ; Chalon, S. ; Faivre-Chauvet, A. ; Leray, P. ; Morteau, E. ; Servagent, N. ; Thers, D.
Author_Institution :
Subatech, Ecole des Mines de Nantes, Nantes, France
fDate :
Oct. 24 2009-Nov. 1 2009
Abstract :
The à autoradiography is commonly used in preclinical research. This technique is able to locate, in 2 dimensions with a high spatial resolution, molecule labeled with à emitters. We report on the development of an integrated and transportable device base on the PIM (Parallel Ionization Multiplier) structure able to perform the image of 10 microscope slides in the same time. Thin slices of organs can be labeled with à emitters of low energy like 3H/14C or Auger electrons emitters such as 125I / 99mTc. The measured spatial resolution over the whole area of 18Ã18 cm2 is 30 ¿m full width at half maximum in 2D with a 3H labeling. The sensitivity threshold is estimated to be close to 0.005 cps/min/mm2. The use in proportional counter mode is suitable to perform on-line imaging and monitoring. New modalities such as large area imaging of entire rat slices or imaging of à emitters of high energy like 131I or 18F are now under development. In case of labeling with à emitters of high energy, the spatial resolution is estimated to be around 200 ¿m. First results obtained with these new configurations will be presented.
Keywords :
position sensitive particle detectors; proportional counters; radiography; Auger electrons emitters; PIM structure; beta emitters; high sensitive digital beta autoradiograph; online imaging; online monitoring; parallel ionization multiplier structure; preclinical research; proportional counter mode; transportable device; Area measurement; Counting circuits; Electron guns; Energy measurement; High-resolution imaging; Ionization; Labeling; Microscopy; Monitoring; Spatial resolution;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4244-3961-4
Electronic_ISBN :
1095-7863
DOI :
10.1109/NSSMIC.2009.5401854