Title :
Sterilization and surface decontamination by a novel VHF-CCP
Author :
Stapelmann, K. ; Bibinov, N. ; Denis, B. ; Semmler, E. ; Awakowicz, P.
Author_Institution :
Inst. for Electr. Eng. & Plasma Technol., Ruhr-Univ. Bochum, Bochum, Germany
Abstract :
Summary form only given. The application of low pressure plasma discharges for sterilization of medical instruments is an upcoming alternative to common sterilization methods, due to the variety of drawbacks, e.g. high temperature, toxic chemical agents, or the inability to sterilize and remove pathogenic material, commonly used methods are associated with. Plasma sterilization offers a highly effective, low temperature sterilization and decontamination process with a reduced process time.The capabilities of plasma treatment have been demonstrated in several laboratory setups1"3. Based on these experiences, a novel setup has been developed. It is realized as capacitively coupled plasma discharge powered by an oscillator power source in the variable frequency range between 76 and 80 MHz. The setup is designed to meet industrial needs. The discharge chamber is shaped like a drawer and composed of PEEK, a high-performance plastic. This leads to an easy handling sterilization process uncomplicated for application. Optical emission spectroscopy was performed to obtain detailed information about the plasma parameters and to optimize the plasma for sterilization purpose. Microbiological tests as well as protein removal tests are going to be presented.
Keywords :
biomedical equipment; decontamination; discharges (electric); plasma applications; plasma pressure; plasma temperature; sterilisation (microbiological); capacitively coupled plasma discharge; discharge chamber; frequency 76 MHz to 80 MHz; high-performance plastic; low pressure plasma discharge; low temperature sterilization; medical instrument; microbiological test; optical emission spectroscopy; oscillator power source; pathogenic material; plasma sterilization; plasma treatment; sterilization method; surface decontamination; toxic chemical agents; Decontamination; Fault location; Instruments; Plasma applications; Plasma chemistry; Plasma materials processing; Plasma sources; Plasma temperature; Surface discharges; Testing;
Conference_Titel :
Plasma Science, 2010 Abstracts IEEE International Conference on
Conference_Location :
Norfolk, VA
Print_ISBN :
978-1-4244-5474-7
Electronic_ISBN :
0730-9244
DOI :
10.1109/PLASMA.2010.5534056