• DocumentCode
    3330056
  • Title

    Reaction of an L-C filter to a switching-on event

  • Author

    Finkeistein, I. ; Axelrod, A. ; Joffe, Elya B.

  • Author_Institution
    EMI Test Lab. Ltd., Moshav Hanniel, Israel
  • fYear
    195
  • fDate
    14-18 Aug 195
  • Firstpage
    417
  • Lastpage
    422
  • Abstract
    This paper examines the effect of linear filter characteristics on the suppression of transient-type interference, such as that generated by the switching of inductive loads, relay contacts, etc. The requirements for suppression of such emissions are specified in various standards and specifications, e.g., MIL-STD-461C CE07 Method. Although these interference modes are expressed in the time domain, often linear filters are used for their suppression. The performance of these filters in the suppression of such transients is determined by the parasitic characteristics of the filter elements. The analysis of the effects of these characteristics of the filter is the objective of this paper. Based upon predicted voltages and current overshoot values, selection of filter components can be conducted in a well-established manner, and reliable operation of load circuits can be ensured
  • Keywords
    capacitance; inductance; interference suppression; passive filters; power system transients; transient analysis; L-C filter; MIL-STD-461C CE07 Method; current overshoot values; filter components selection; filter elements; inductive loads; interference modes; linear filter characteristics; load circuits; parasitic characteristics; relay contact; relay contacts; specifications; standards; switching on event; switching transients; time domain; transient type interference suppression; voltage overshoot values; Batteries; Circuit analysis; Circuit testing; Electromagnetic interference; Inductors; Interference suppression; Nonlinear filters; Project engineering; Relays; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 1995. Symposium Record., 1995 IEEE International Symposium on
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    0-7803-3608-9
  • Type

    conf

  • DOI
    10.1109/ISEMC.1995.523593
  • Filename
    523593