Title :
Defect-based delay testing of resistive vias-contacts a critical evaluation
Author :
Baker, Keith ; Gronthoud, Guido ; Lousberg, Maurice ; Schanstra, Ivo ; Hawkins, Charles
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
Abstract :
This defect-based study analyzes statistical signal delay properties and delay fault test pattern constraints in the CMOS deep submicron environment. Delay fault testing has uncertainty, or noise, in its attempt to detect defects that slow a signal. CMOS resistive vias and contacts were used as a delay defect target. Data were taken from a scan-based test chip (Veqtor) on the Philips 0.25 μm technology. Methods to improve delay fault defect detection are given
Keywords :
CMOS logic circuits; delays; failure analysis; fault diagnosis; integrated circuit testing; logic testing; statistical analysis; 0.25 mum; CMOS; MOS resistive vias; Philips; Veqtor; critical evaluation; defect-based analysis; delay defect target; delay fault defect detection; delay fault test pattern; delay testing; noise; resistive vias-contacts; scan-based test chip; signal delay properties; statistical analysis; Circuit faults; Circuit testing; Clocks; Delay; Fault detection; Integrated circuit modeling; Integrated circuit testing; Logic testing; System testing; Timing;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805769
