Title :
Limited access testing of analog circuits: handling tolerances
Author :
Ahrikencheikh, Cherif ; Spears, Michael
Author_Institution :
Hewlett-Packard Co., Loveland, CO, USA
Abstract :
This paper deals with in-circuit testing of analog circuits that have limited access. A new method to account for tolerances on device values is presented, with results illustrating good performance in a production test environment
Keywords :
analogue integrated circuits; fault location; integrated circuit testing; linear programming; printed circuit testing; voltage measurement; admittance; analog circuits; component tolerance; handling tolerances; in-circuit testing; limited access testing; linear programming; production test; singular value decomposition; Analog circuits; Circuit faults; Circuit testing; Electrical fault detection; Fault diagnosis; Linear programming; Performance evaluation; Production; Singular value decomposition; Voltage measurement;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805782
