Title :
Unified theory on wireless communication fading statistics based on SIRP
Author :
Yao, Kai ; Simon, M.K. ; Bigileri, E.
Author_Institution :
Electr. Eng. Dept., Univ. of California, Los Angeles, Los Angeles, CA, USA
Abstract :
Under various outdoor/indoor narrowband flat fading scenarios, a variety of statistical models of envelope distributions, such as Rayleigh, Rician, exponential, Nakagami-m, Weibull, lognormal, Kv etc., have been proposed. We show that spherically-invariant random processes (SIRP) and Fox H-functions can be used to provide a unified theory to model these fading channel statistics. Various performance measures of fading communication systems, such as error probability and "amount of fading," can be evaluated using the SIRP statistical characterization.
Keywords :
Gaussian processes; error statistics; fading channels; indoor radio; random processes; Fox H-function; SIRP statistical characterization; envelope distribution; fading channel statistic; outdoor-indoor narrowband flat fading scenario; spherically-invariant random processes; unified theory; wireless communication; Communication systems; Nakagami distribution; Narrowband; Random processes; Rayleigh channels; Rician channels; Statistical distributions; Statistics; Weibull fading channels; Wireless communication;
Conference_Titel :
Signal Processing Advances in Wireless Communications, 2004 IEEE 5th Workshop on
Conference_Location :
Lisbon
Print_ISBN :
0-7803-8337-0
DOI :
10.1109/SPAWC.2004.1439219
