DocumentCode
3330526
Title
Closing The Gap Between Process Development and Mixed Signal Design and Testing
Author
Haggag, Hosam
Author_Institution
National Semiconductor
fYear
1999
fDate
1999
Firstpage
651
Lastpage
651
Keywords
Costs; Process design; Product development; Semiconductor device testing; Signal design; Signal processing; Standards development; System testing; System-on-a-chip; Time to market;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1999. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-5753-1
Type
conf
DOI
10.1109/TEST.1999.805792
Filename
805792
Link To Document