Title :
Closing The Gap Between Process Development and Mixed Signal Design and Testing
Author_Institution :
National Semiconductor
Keywords :
Costs; Process design; Product development; Semiconductor device testing; Signal design; Signal processing; Standards development; System testing; System-on-a-chip; Time to market;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805792
