DFT, test lifecycles and the product lifecycle

Author

Robinson, Gordon D.

Author_Institution

Credence Syst. Corp., Fremont, CA, USA

fYear

1999

fDate

1999

Firstpage

705

Lastpage

713

Abstract

There´s more to DFT than scan, BIST and ATPG. These have automated the easy tasks, yet many activities in the lifecycles of tests and products use less formalized DFT methods and tools. Three independent but interacting lifecycles are used to identify activities that DFT should help. These lifecycles illustrate the technical and managerial constraints on making full use of DFT structures, particularly for the critical project-threatening tasks where not everything goes smoothly

Keywords

automatic test equipment; automatic test software; built-in self test; computer testing; design for testability; integrated circuit testing; life testing; printed circuit testing; production testing; ASIC production test; BIST; DFT; Oracle; board production test; critical project-threatening tasks; integration lifecycle; managerial constraints; product lifecycle; system diagnostics; technical constraints; test equipment; test lifecycles; test software; Automatic test pattern generation; Automatic testing; Automation; Built-in self-test; Design for testability; Discrete Fourier transforms; Fault diagnosis; Life testing; Production; Project management;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1999. Proceedings. International

Conference_Location

Atlantic City, NJ

ISSN

1089-3539

Print_ISBN

0-7803-5753-1

Type

conf

DOI

10.1109/TEST.1999.805799

Filename

805799