Title :
Current ratios: a self-scaling technique for production IDDQ testing
Author :
Maxwell, Peter ; O´Neill, Pete ; Aitken, Rob ; Dudley, Roland ; Jaarsma, Neal ; Quach, Minh ; Wiseman, Don
Author_Institution :
Integrated Bus. Div., Hewlett-Packard Co., USA
Abstract :
The use of a single pass/fail threshold for IDDQ testing is unworkable as chip background currents increase to the point where they exceed many defect currents. This paper describes a method of using “current signatures” which uses only simple comparisons on the tester, and which automatically scales with process variations which give a wide range of background currents. Dynamic thresholds are used, based on the ratio of maximum to minimum current. Using a single IDDQ measurement for each die, upper and lower comparator values are set, against which IDDQ for each vector in the suite is compared. Production data is presented to verify the validity of the method
Keywords :
electric current measurement; fault diagnosis; integrated circuit testing; production testing; vectors; acceptance limits; current ratios; current signatures; defective die detection; dynamic thresholds; lower comparator value; maximum to minimum current ratio; minimum current vector; process variations; production IDDQ testing; self-scaling technique; single IDDQ measurement; test thresholds; upper comparator value; Automatic testing; Circuit testing; Companies; Costs; Current measurement; Fabrication; Integrated circuit testing; Leakage current; Life testing; Production;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805803
