Title :
Accuracy requirements in at-speed functional test
Author :
West, Burnell G.
Author_Institution :
Schlumberger ATE, San Jose, CA, USA
Abstract :
This paper analyzes the requirements of at-speed functional testing of high-speed devices. We conclude that, although the requirement forecast by the International Technology Roadmap for Semiconductors is excessive, higher accuracy at-speed functional test systems are needed to qualify the high-performance devices anticipated in the next decade. We also conclude that, while challenging, the necessary higher speeds and accuracies can be realized
Keywords :
automatic testing; design for testability; digital integrated circuits; high-speed integrated circuits; integrated circuit testing; accuracy requirements; at-speed functional test; digital IC test; high-performance devices; high-speed devices; input timing accuracy; metastability; yield model; Accuracy; Circuit noise; Circuit testing; Design for testability; Electronic equipment testing; Metastasis; Physics; Semiconductor device testing; Test equipment; Timing;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805808
