DocumentCode :
3330984
Title :
Analysis of the electrical performance of multi-coupled high-speed interconnects for SoP
Author :
Vega-González, Víctor H. ; Torres-Torres, Reydezel ; Sánchez, Adan S.
Author_Institution :
Electron. Dept., INAOE, Puebla, Mexico
fYear :
2009
fDate :
2-5 Aug. 2009
Firstpage :
1030
Lastpage :
1033
Abstract :
In this work, we present an efficient methodology for designing and evaluating the performance of current and future multi-Gb/s chip-to-chip interconnects for Systems on Package (SoP). We analyze the coupling between neighboring stripline and microstrip lines in single ended and differential configurations. Furthermore, the method also considers conductor and dielectric losses. In order to obtain the system bandwidth and area efficiency, an exhaustive analysis of downscaled versions of current SoP interconnects was carried out. This analysis also allowed to find the optimal structure for given specifications (e.g. interconnects density, minimum bandwidth, and transmission line length). Experimentally validated 2D simulators and PDA (peak distortion analysis) tools were used in this process.
Keywords :
dielectric losses; high-speed integrated circuits; integrated circuit design; integrated circuit interconnections; system-on-package; 2D simulators; PDA tools; SoP; chip-to-chip interconnects design; dielectric losses; differential configuration; electrical performance analysis; multicoupled high-speed interconnects; peak distortion analysis tools; systems on package; Analytical models; Bandwidth; Conductors; Design methodology; Dielectric losses; Microstrip; Packaging; Performance analysis; Stripline; Transmission lines; Crosstalk; PDA; SoP; bandwidth per line density;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2009. MWSCAS '09. 52nd IEEE International Midwest Symposium on
Conference_Location :
Cancun
ISSN :
1548-3746
Print_ISBN :
978-1-4244-4479-3
Electronic_ISBN :
1548-3746
Type :
conf
DOI :
10.1109/MWSCAS.2009.5235977
Filename :
5235977
Link To Document :
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