Title :
The attack of the “Holey Shmoos”: a case study of advanced DFD and picosecond imaging circuit analysis (PICA)
Author :
Huott, William ; McManus, Moyra ; Knebel, Daniel ; Steen, Steven ; Manzer, Dennis ; Sanda, P. ; Wilson, Steven ; Chan, Yuen ; Pelella, Antonio ; Polonsky, Stanislav
Author_Institution :
IBM Corp., Poughkeepsie, NY, USA
Abstract :
This paper will provide a case study of a particularly difficult debug problem (the Holey Shmoo problem) which developed while designing the IBM System/390 G6 637 MHz microprocessor chip. Resolution of this problem involved the use of some of today´s newest DFD/DFT and diagnostics techniques. The discussion of the Holey Shmoo problem and its debug will serve to highlight and demonstrate some of these advanced techniques
Keywords :
VLSI; built-in self test; design for testability; digital signal processing chips; image processing equipment; integrated circuit testing; logic testing; waveform analysis; 637 MHz; DFD/DFT; Holey Shmoo problem; IBM System/390 G6 microprocessor chip; RAMBIST engine; focused ion beam verification; picosecond imaging circuit analysis; waveform analysis; CMOS technology; Circuit analysis; Computer aided software engineering; Design for disassembly; Image analysis; Logic testing; Microprocessor chips; Propagation delay; Random access memory; Voltage;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805820
