The attack of the “Holey Shmoos”: a case study of advanced DFD and picosecond imaging circuit analysis (PICA)

Author

Huott, William ; McManus, Moyra ; Knebel, Daniel ; Steen, Steven ; Manzer, Dennis ; Sanda, P. ; Wilson, Steven ; Chan, Yuen ; Pelella, Antonio ; Polonsky, Stanislav

Author_Institution

IBM Corp., Poughkeepsie, NY, USA

fYear

1999

fDate

1999

Firstpage

883

Lastpage

891

Abstract

This paper will provide a case study of a particularly difficult debug problem (the Holey Shmoo problem) which developed while designing the IBM System/390 G6 637 MHz microprocessor chip. Resolution of this problem involved the use of some of today´s newest DFD/DFT and diagnostics techniques. The discussion of the Holey Shmoo problem and its debug will serve to highlight and demonstrate some of these advanced techniques

Keywords

VLSI; built-in self test; design for testability; digital signal processing chips; image processing equipment; integrated circuit testing; logic testing; waveform analysis; 637 MHz; DFD/DFT; Holey Shmoo problem; IBM System/390 G6 microprocessor chip; RAMBIST engine; focused ion beam verification; picosecond imaging circuit analysis; waveform analysis; CMOS technology; Circuit analysis; Computer aided software engineering; Design for disassembly; Image analysis; Logic testing; Microprocessor chips; Propagation delay; Random access memory; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1999. Proceedings. International

Conference_Location

Atlantic City, NJ

ISSN

1089-3539

Print_ISBN

0-7803-5753-1

Type

conf

DOI

10.1109/TEST.1999.805820

Filename

805820