• DocumentCode
    3331076
  • Title

    A high-level BIST synthesis method based on a region-wise heuristic for an integer linear programming

  • Author

    Kim, Han Bin ; Ha, Dong Sam

  • Author_Institution
    Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    903
  • Lastpage
    912
  • Abstract
    A high-level built-in self-test (BIST) synthesis involves several tasks such as system register assignment, interconnection assignment, and BIST register assignment. Existing high-level BIST synthesis methods perform the tasks sequentially at the cost of global optimality. We proposed a new approach based on an integer linear programming (ILP). Our method achieves optimal solutions for most circuits in hardware overhead, but it takes a long processing time. In this paper, we present a heuristic method to address this problem. The heuristic partitions a given data flow graph into smaller regions based on control steps and applies the ILP for each region successively. Our heuristic reduces the processing time by several orders of magnitude, while the quality of the solution is slightly compromised. We present experimental results for six circuits and compare the results with other BIST synthesis methods
  • Keywords
    built-in self test; data flow graphs; high level synthesis; integer programming; linear programming; logic partitioning; state assignment; BIST register assignment; control steps; data flow graph partitioning; global optimality; hardware overhead; high-level BIST synthesis; integer linear programming; interconnection assignment; optimal solutions; parallel BIST; reduced processing time; region-wise heuristic; system register assignment; Built-in self-test; Circuit synthesis; Circuit testing; Flow graphs; Hardware; High level synthesis; Integer linear programming; Integrated circuit interconnections; Processor scheduling; Registers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1999. Proceedings. International
  • Conference_Location
    Atlantic City, NJ
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5753-1
  • Type

    conf

  • DOI
    10.1109/TEST.1999.805822
  • Filename
    805822