Title :
A high-level BIST synthesis method based on a region-wise heuristic for an integer linear programming
Author :
Kim, Han Bin ; Ha, Dong Sam
Author_Institution :
Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Abstract :
A high-level built-in self-test (BIST) synthesis involves several tasks such as system register assignment, interconnection assignment, and BIST register assignment. Existing high-level BIST synthesis methods perform the tasks sequentially at the cost of global optimality. We proposed a new approach based on an integer linear programming (ILP). Our method achieves optimal solutions for most circuits in hardware overhead, but it takes a long processing time. In this paper, we present a heuristic method to address this problem. The heuristic partitions a given data flow graph into smaller regions based on control steps and applies the ILP for each region successively. Our heuristic reduces the processing time by several orders of magnitude, while the quality of the solution is slightly compromised. We present experimental results for six circuits and compare the results with other BIST synthesis methods
Keywords :
built-in self test; data flow graphs; high level synthesis; integer programming; linear programming; logic partitioning; state assignment; BIST register assignment; control steps; data flow graph partitioning; global optimality; hardware overhead; high-level BIST synthesis; integer linear programming; interconnection assignment; optimal solutions; parallel BIST; reduced processing time; region-wise heuristic; system register assignment; Built-in self-test; Circuit synthesis; Circuit testing; Flow graphs; Hardware; High level synthesis; Integer linear programming; Integrated circuit interconnections; Processor scheduling; Registers;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805822