DocumentCode
3331154
Title
On-line fault detection in DSP circuits using extrapolated checksums with minimal test points
Author
Chakrabarti, Sudip ; Chatterjee, Abhijit
Author_Institution
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear
1999
fDate
1999
Firstpage
955
Lastpage
963
Abstract
In this paper, we propose a novel concurrent error detection scheme for linear digital variable systems that significantly reduces the hardware overhead of the detection circuitry. A new theory of extrapolated checksums has been developed. A novel test point selection algorithm has been proposed to select the minimal set of test points without compromising fault coverage. Techniques for selecting code vectors (to compute checksums) and designing error detection circuitry have been discussed. Experimental results indicate significant hardware reduction in the error detection circuitry
Keywords
data flow graphs; digital filters; digital signal processing chips; error detection codes; fault simulation; fault tolerant computing; integrated circuit testing; DSP circuits; code vectors selection; concurrent error detection scheme; data flow graphs; elliptic filter circuit; error detection circuitry; error latency; extrapolated checksums; fault coverage; fault models; fault tolerant systems; gain matrix; linear digital variable systems; minimal test points; on-line fault detection; reduced hardware overhead; test point selection algorithm; Circuit faults; Circuit testing; Digital signal processing; Electrical fault detection; Fault detection; Fault tolerance; Fault tolerant systems; Hardware; Signal processing algorithms; Space technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1999. Proceedings. International
Conference_Location
Atlantic City, NJ
ISSN
1089-3539
Print_ISBN
0-7803-5753-1
Type
conf
DOI
10.1109/TEST.1999.805828
Filename
805828
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