DocumentCode :
3331192
Title :
On the charge density measured by the capacitive probe
Author :
Fang, Zhu
Author_Institution :
Centre for Electr. Power Eng., Strathclyde Univ., Glasgow, UK
fYear :
1996
fDate :
25-30 Sep 1996
Firstpage :
229
Lastpage :
234
Abstract :
In investigation on behaviour of excess charge on an electric insulator, a capacitive probe is usually used to detect this charge. The relation between response of the probe and the excess charge density varies with the shape of the insulator. For very thin film, the record of the probe is 1/εr times of the excess charge density; and 2ε0/(ε01 ) times of the excess charge density for thick slab. In the case of right cylindrical spacer, the response of the probe is equal to the excess charge density when its distribution on the circumference is uniform
Keywords :
charge measurement; insulating thin films; insulator testing; probes; capacitive probe; charge density measurement; charge distribution; electric insulator; excess charge; right cylindrical spacer; Capacitive sensors; Charge measurement; Conductive films; Current measurement; Density measurement; Dielectric measurements; Gas insulation; Polarization; Probes; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrets, 1996. (ISE 9), 9th International Symposium on
Conference_Location :
Shanghai
Print_ISBN :
0-7803-2695-4
Type :
conf
DOI :
10.1109/ISE.1996.578074
Filename :
578074
Link To Document :
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