DocumentCode :
3331219
Title :
An on-line BISTed SRAM IP core
Author :
Lobetti-Bodoni, M. ; Pricco, Alessio ; Benso, Alfredo ; Chiusano, Silvia ; Prinetto, Paolo
Author_Institution :
Castelletto di Settimo Milanese, Italtel SpA, Milan, Italy
fYear :
1999
fDate :
1999
Firstpage :
993
Lastpage :
1000
Abstract :
In digital systems design, strict reliability constraints usually impose very low fault latency and high degree of fault detection of permanent and transient faults. In particular, memory modules, as either devices or IP cores, appeared as one of the most critical parts. This paper presents an advanced on-line memory BIST architecture implemented as an IP core developed for telecommunication applications. A fault latency reduction architecture, a code-based fault detection scheme, and an architecture-based fault avoidance have been composed to meet the required reliability constraints
Keywords :
SRAM chips; built-in self test; error correction codes; fault tolerance; integrated circuit reliability; integrated circuit testing; logic testing; architecture-based fault avoidance; code-based fault detection scheme; data fault tolerance; design constraints; fault latency reduction architecture; global architecture; logic fault tolerance; on-line BISTed SRAM IP core; on-line memory BIST architecture; reliability constraints; transient faults; Asynchronous transfer mode; Availability; Built-in self-test; Delay; Fault detection; Memory architecture; Pulp manufacturing; Random access memory; System testing; Telecommunications;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
ISSN :
1089-3539
Print_ISBN :
0-7803-5753-1
Type :
conf
DOI :
10.1109/TEST.1999.805832
Filename :
805832
Link To Document :
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