Title :
The effects of test compaction on fault diagnosis
Author :
Shao, Yun ; Guo, Ruifeng ; Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
Abstract :
The effect of test compaction on fault diagnosis is experimentally investigated. Results for combinational and sequential circuits indicate that the diagnostic resolution achieved by compacted tests is only minimally lower than that for uncompacted tests. Furthermore, the diagnostic resolution of the compacted tests can be enhanced to be the same or better than that for the uncompacted rests while still retaining compactness
Keywords :
combinational circuits; fault diagnosis; logic testing; sequential circuits; combinational circuits; compacted tests; diagnostic resolution; fault diagnosis; logic testing; sequential circuits; test compaction; uncompacted tests; Circuit faults; Circuit testing; Cities and towns; Combinational circuits; Compaction; Electrical fault detection; Fault detection; Fault diagnosis; Sequential analysis; Sequential circuits;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805842
