DocumentCode
3331541
Title
Far-Field Emission Patterns and the Emission Positions of Individual Cavity Modes in a Highly Deformed Microcavity
Author
Lee, Sang-Bum ; Shim, Jeong-Bo ; Yang, Juhee ; Moon, Songky ; Kim, Sang-Wook ; Lee, Jai-Hyung ; An, Kyungwon
Author_Institution
Seoul Nat. Univ., Seoul
Volume
4
fYear
2007
fDate
1-5 July 2007
Firstpage
173
Lastpage
175
Abstract
The characteristics of quasi-bound states of a highly deformed microcavity were investigated in both theory and experiment. Five distinct mode groups were observed with cavity quality factors different by several orders of magnitude in the range of 104 - 106. Consistently they had quite different intracavity mode distributions. However, their far-field emission patterns were found to be almost identical, contrary to common understanding that the emission direction is usually associated with the internal mode distribution. Both the observed far-field patterns and emission positions support that the output emissions are mostly due to the refractive escape at the common emission points determined by the unstable manifold of ray trajectory crossing the critical line of total internal reflection regardless of mode groups.
Keywords
Q-factor; cavity resonators; micro-optomechanical devices; microcavities; micromechanical resonators; ray tracing; cavity quality factors; far-field emission patterns; intracavity mode distribution; quadrupole-deformed microcavity; quasibound states; ray trajectory; total internal reflection; Chaos; Fiber lasers; Laser excitation; Microcavities; Moon; Optical polarization; Pump lasers; Reflection; Resonance; Rotation measurement; deformed microcavity; scar modes; unstable manifold;
fLanguage
English
Publisher
ieee
Conference_Titel
Transparent Optical Networks, 2007. ICTON '07. 9th International Conference on
Conference_Location
Rome
Print_ISBN
1-4244-1249-8
Electronic_ISBN
1-4244-1249-8
Type
conf
DOI
10.1109/ICTON.2007.4296370
Filename
4296370
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