مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3331550

Title :

High Time For High Level ATPG

Author :

Iyer, Mahesh A.

Author_Institution :

Synopsys, Inc.

fYear :

1999

fDate :

1999

Firstpage :

1112

Lastpage :

1112

Keywords :

Automatic test pattern generation; Automatic testing; Circuit synthesis; Computer aided manufacturing; Crosstalk; Design automation; Hardware design languages; National electric code; Sun; Timing;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Test Conference, 1999. Proceedings. International

ISSN :

1089-3539

Print_ISBN :

0-7803-5753-1

Type :

conf

DOI :

10.1109/TEST.1999.805847

Filename :

805847

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3331550