DocumentCode
3331639
Title
High Time for Higher Level BIST
Author
Papachristou, Chris
Author_Institution
Case Western Reserve University
fYear
1999
fDate
1999
Firstpage
1117
Lastpage
1117
Keywords
Automatic test pattern generation; Built-in self-test; Circuit faults; Circuit synthesis; Circuit testing; Design methodology; Logic design; Logic testing; Manufacturing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1999. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-5753-1
Type
conf
DOI
10.1109/TEST.1999.805851
Filename
805851
Link To Document