مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

3331669

Title :

High-level ATPG for Early Power Analysis

Author :

Roethig, Wolfgang

Author_Institution :

NEC Electronics

fYear :

1999

fDate :

1999

Firstpage :

1119

Lastpage :

1119

Keywords :

Analytical models; Automatic test pattern generation; Circuit simulation; Circuit testing; Energy consumption; National electric code; Power generation; Power measurement; Silicon; Statistics;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Test Conference, 1999. Proceedings. International

ISSN :

1089-3539

Print_ISBN :

0-7803-5753-1

Type :

conf

DOI :

10.1109/TEST.1999.805853

Filename :

805853

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3331669