Title :
SIA Roadmaps: Sunset Boulevard for lDDQ
Author_Institution :
Philips ED&T/Test
Keywords :
Bridges; CMOS technology; Current measurement; Delay effects; Fault detection; Instruments; Integrated circuit testing; Phase change materials; Ring oscillators; USA Councils;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805854