Title :
Thin Gate Oxide Reliability
Author :
Roehr, Jeffrey L.
Author_Institution :
Analog Devices
Keywords :
Circuit testing; Electric breakdown; Leak detection; Leakage current; Life estimation; Life testing; Lifetime estimation; Low voltage; Physics; Tunneling;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805855
