Title :
Benchmarking DAT with the ITC´99 ATPG Benchmarks
Author :
Konijnenburg, Mario ; van der Linden, Hans ; Geuzebroek, Jeroen
Author_Institution :
Philips Ragearch Laboratories
Keywords :
Automatic test pattern generation; Automatic testing; Benchmark testing; Built-in self-test; Circuit faults; Circuit testing; Combinational circuits; Information technology; Logic testing; Sequential analysis;
Conference_Titel :
Test Conference, 1999. Proceedings. International
Print_ISBN :
0-7803-5753-1
DOI :
10.1109/TEST.1999.805859
