• DocumentCode
    3331763
  • Title

    Benchmarking DAT with the ITC´99 ATPG Benchmarks

  • Author

    Konijnenburg, Mario ; van der Linden, Hans ; Geuzebroek, Jeroen

  • Author_Institution
    Philips Ragearch Laboratories
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1127
  • Lastpage
    1127
  • Keywords
    Automatic test pattern generation; Automatic testing; Benchmark testing; Built-in self-test; Circuit faults; Circuit testing; Combinational circuits; Information technology; Logic testing; Sequential analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1999. Proceedings. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5753-1
  • Type

    conf

  • DOI
    10.1109/TEST.1999.805859
  • Filename
    805859
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3331763