• DocumentCode
    3331782
  • Title

    Application of Tools Developed at the University of Iowa to ITC-99 Benchmarks

  • Author

    Reddy, Sudhakar M.

  • Author_Institution
    University of Iowa
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1128
  • Lastpage
    1128
  • Keywords
    Circuit faults; Circuit testing; Compaction; Design automation; Logic testing; Sequential analysis; Sequential circuits; System testing; Test pattern generators; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1999. Proceedings. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5753-1
  • Type

    conf

  • DOI
    10.1109/TEST.1999.805860
  • Filename
    805860
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3331782