DocumentCode
3331800
Title
Automatic Functional Test Generation - A Reality
Author
Tapuri, R.S.
Author_Institution
Texas Microprocessor Division
fYear
1999
fDate
1999
Firstpage
1130
Lastpage
1130
Keywords
Art; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Design for testability; Geometry; Microprocessors; Test pattern generators; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1999. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-5753-1
Type
conf
DOI
10.1109/TEST.1999.805862
Filename
805862
Link To Document