DocumentCode :
3331800
Title :
Automatic Functional Test Generation - A Reality
Author :
Tapuri, R.S.
Author_Institution :
Texas Microprocessor Division
fYear :
1999
fDate :
1999
Firstpage :
1130
Lastpage :
1130
Keywords :
Art; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Design for testability; Geometry; Microprocessors; Test pattern generators; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1999. Proceedings. International
ISSN :
1089-3539
Print_ISBN :
0-7803-5753-1
Type :
conf
DOI :
10.1109/TEST.1999.805862
Filename :
805862
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3331800
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