DocumentCode

3331810

Title

Panel: Increasing test coverage in a VLSI desgin course

Author

Agrawal, Vishwani D.

Author_Institution

Bell Labs, Lucent Technologies

fYear

1999

fDate

30-30 Sept. 1999

Firstpage

1131

Lastpage

1131

Keywords

Design engineering; Educational institutions; Jacobian matrices; Materials testing; Paper technology; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1999. Proceedings. International

Conference_Location

Atlantic City, NJ, USA

ISSN

1089-3539

Print_ISBN

0-7803-5753-1

Type

conf

DOI

10.1109/TEST.1999.805863

Filename

805863