DocumentCode :
3331825
Title :
Position Statement: Increasing Test Coverage in a VLSI Design Course
Author :
Abraham, Jacob A.
Author_Institution :
The University of Texas at Austin
fYear :
1999
fDate :
30-30 Sept. 1999
Firstpage :
1132
Lastpage :
1132
Abstract :
It is argued that test and verification (validation) have a lot in common. The test problem is a (small) subset I of the verification problem. The concept of justification is useful for both problems. Practical formal Bbolean equivalence checking tools draw heavily on algorithms from the test field. ATPG techniqu~s are beginning to be applied to other verification problems. A VLSI design course should, therefore, emphasize both manufacturing test and design verification as necessary to produce a quality ptoduct, and these topics should comprise a significant part of the content of the course.
Keywords :
Jacobian matrices; Testing; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ, USA
ISSN :
1089-3539
Print_ISBN :
0-7803-5753-1
Type :
conf
DOI :
10.1109/TEST.1999.805864
Filename :
805864
Link To Document :
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