DocumentCode

3331858

Title

VLSI design 101 - The test module

Author

Harrington, J.

Author_Institution

Lucent Technologies

fYear

1999

fDate

30-30 Sept. 1999

Firstpage

1134

Lastpage

1134

Keywords

Controllability; Design for testability; Flip-flops; Isolation technology; Microelectronics; Observability; Stress; Testing; Timing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1999. Proceedings. International

Conference_Location

Atlantic City, NJ, USA

ISSN

1089-3539

Print_ISBN

0-7803-5753-1

Type

conf

DOI

10.1109/TEST.1999.805866

Filename

805866