• DocumentCode
    3331873
  • Title

    Increasing test coverage in a VLSI design course

  • Author

    Robert, Michel

  • Author_Institution
    LIRMM
  • fYear
    1999
  • fDate
    30-30 Sept. 1999
  • Firstpage
    1135
  • Lastpage
    1135
  • Keywords
    Circuit testing; Design engineering; Industrial training; Integrated circuit testing; Management training; Manufacturing; Microelectronics; Performance evaluation; Production; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1999. Proceedings. International
  • Conference_Location
    Atlantic City, NJ, USA
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5753-1
  • Type

    conf

  • DOI
    10.1109/TEST.1999.805867
  • Filename
    805867
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3331873