DocumentCode :
3331873
Title :
Increasing test coverage in a VLSI design course
Author :
Robert, Michel
Author_Institution :
LIRMM
fYear :
1999
fDate :
30-30 Sept. 1999
Firstpage :
1135
Lastpage :
1135
Keywords :
Circuit testing; Design engineering; Industrial training; Integrated circuit testing; Management training; Manufacturing; Microelectronics; Performance evaluation; Production; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1999. Proceedings. International
Conference_Location :
Atlantic City, NJ, USA
ISSN :
1089-3539
Print_ISBN :
0-7803-5753-1
Type :
conf
DOI :
10.1109/TEST.1999.805867
Filename :
805867
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3331873
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